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ELECTRONICS & SEMICONDUCTORS

DFT & ATPG fault coverage

DFT & ATPG fault coverage is an OpenEnv-compatible reinforcement learning environment in our Electronics & Semiconductors catalog. An agent acts through the tools below, and a deterministic verifier scores every episode, so the reward can be used for GRPO or other RLVR post-training.

Task and verification

Insert scan chains, BIST controllers, and boundary-scan logic into digital netlists, generating test vectors that achieve target stuck-at and at-speed fault coverage with minimal area overhead.

Tools and runtime

Yosys + Fault + OpenROAD DFT + ATPG vector generators

OPENENV / ATPG

#design-for-test#atpg#scan-chains#fault-coverage

Related Electronics & Semiconductors gyms

  • Verilog RTL design & verification
  • Chip physical design (RTL-to-GDSII)
  • SKY130 analog IC design
  • KiCad PCB layout & routing
  • Power electronics & converter design
  • DSP & digital communications
  • RF & antenna impedance matching
  • Electromagnetic & motor design
  • Semiconductor process recipes
  • Automated instrument calibration (PyVISA)
  • Embedded firmware & safety drivers

See how these environments are run privately on the custom RL environments page, and how their rewards are made hard to game in our verifier design guide.

Plan a training run

Check the environment’s availability, compatible models and compute in Studio. A catalog entry does not guarantee that hosted training is enabled for your workspace.

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