gfactor technologiesOpen Studio

ELECTRONICS & SEMICONDUCTORS

DFT & ATPG fault coverage

Task and verification

Insert scan chains, BIST controllers, and boundary-scan logic into digital netlists, generating test vectors that achieve target stuck-at and at-speed fault coverage with minimal area overhead.

Tools and runtime

Yosys + Fault + OpenROAD DFT + ATPG vector generators

OPENENV / ATPG

#design-for-test#atpg#scan-chains#fault-coverage

Plan a training run

Check the environment’s availability, compatible models and compute in Studio. A catalog entry does not guarantee that hosted training is enabled for your workspace.

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